All Application Case Studies

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• Application
  • Alignment
  • Code inspection
  • Dimensional measurement
  • Error Proofing
  • Food inspection
  • Grading
  • Inspection conveyor
  • Inspection of glass product
  • Inspection of nozzle tip
  • Picking
  • Traffic monitoring
  • Visual inspection
• Industry
  • Agriculture
  • Automotive
  • Electronics
  • Food/Beverage
  • Inspection of iron material
  • Logistics
  • Machine tool
  • Metal / Mining
  • Packaging
  • Retail
  • Semiconductor
• Specification
  • 1.1"(12M) sensor
  • Contrast
  • Depth of Field (DOF)
  • Distortionless
  • Floating System
  • Focus Adjustment
  • Large FOV
  • Limited space
  • Long WD
  • NIR/SWIR
  • Resolution
  • Short WD
  • Vibration Resistant

• • NIR/SWIR
  • Semiconductor
  • Visual inspection
  

  Imaging cracks inside the wafer

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• • Alignment
  • NIR/SWIR
  • Semiconductor
  

  Silicon Wafer Alignment

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• • Code inspection
  • Distortionless
  • Limited space
  • Semiconductor
  

  Inspection of data matrix code on IC chip

  For more information